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This week on Bench Boost Mike explains why sample container choice can significantly impact elemental analysis results through contamination, adsorption, precipitation, chemical attack, or evaporation. The differences in glass vs common plastics are reviewed in detail, and the episode concludes with a brief discussion on proper cleaning/leaching, and the practice using dedicated containers for ultra-trace work.

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This week on Bench Boost Mike explains two key ICP-OES/ICP-MS quality control samples: the Initial Calibration Verification (ICV) and Continuing Calibration Verification (CCV). The ICV is run after calibration and before samples to confirm the calibration worked. The CCV is run periodically during the batch to confirm the calibration remains valid as drift, clogging, cone buildup, washout, or other issues occur. This episode concludes with reviewing how to troubleshoot ICV or CCV failures.

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This week Mike discusses elevated backgrounds in ICP-OES when analyzing high total dissolved solids (TDS) samples such as brines, digests, excipients, salts, and starting materials. TDS increases free electron density in the plasma, producing Bremsstrahlung (braking) radiation and recombination radiation, which raise a broad continuum background across the spectrum. The elevated background degrades signal-to-noise, increases blank standard deviation, and worsens detection limits, especially for elements with poor ICP-OES sensitivity. Mitigation approaches include dilution, matrix-matched calibration or standard additions when dilution isn’t feasible.